Sram power-up system and method

ABSTRACT

A power-up circuit for an SRAM, particularly a loadless 4-T SRAM cell having PMOS access transistors. The power-up circuit disables a current path to the digit lines in an array of SRAM cells during power-up of the SRAM. As a result, the SRAM cells cannot draw power from the digit lines during power-up if voltages on word lines in the array during power-up cause access transistors for the SRAM cells to become conductive.

TECHNICAL FIELD

[0001] This invention relates to static random access memory (“SRAM”)devices, and, more particularly, to a system and method for powering-upSRAM devices having PMOS access transistors to limit the initial currentdraw of such SRAM devices.

BACKGROUND OF THE INVENTION

[0002] Many integrated circuit devices, such as microprocessors, includeonboard memory devices, such as SRAM devices. For example, SRAM devicesare commonly used as cache memory because of their relatively fastspeed. SRAM devices are also sold as stand-alone integrated circuits foruse as cache memory and for other uses. SRAM devices are also moresuitable for use as cache memory than dynamic random access memory(“DRAM”) devices because they need not be refreshed, thus making allSRAM memory cells continuously available for a memory access.

[0003]FIG. 1 is a block diagram of a portion of a typical array 10 ofSRAM cells 12 arranged in rows and columns. A plurality of complementarydigit line pairs D, D* are used to couple complementary data to and fromthe memory cells 12 in a respective column. Several digit line pairs,typically 16 or 32 digit line pairs, are coupled to respective inputs ofa column multiplexer 13. The column multiplexer 13 couples one pair ofdigit lines corresponding to a column address to a sense amplifier 14and a write driver 16. The sense amplifer 14 provides a data output (notshown) indicative the polarity of one digit line D relative to the otherD* responsive to data being read from a memory cell 12 coupled to theselected digit line pair D, D*. The write driver 16 drives adifferential voltage onto the digit lines D, D* to which the writedriver 16 is coupled by the column multiplexer 13. The differentialvoltage applied between the digit lines is indicative of data that is tobe written to a memory cell 12 coupled to the digit lines D, D*. Anequilibration PMOS transistor 18 is also coupled between each pair ofcomplementary digit lines D, D* to equalize the voltage between thedigit lines D, D* prior to a memory read operation. Finally, acomplementary PMOS bias transistor 20 is coupled to each digit line D,D* to lightly bias the digit lines D, D* to V_(CC) for reasons that willbe explained. The current provided by each pair of bias transistors iscontrolled by a respective digit line load signal DLL_(N).

[0004] A plurality of word lines WL1-WL4 are used activate the memorycells 12 in the respective row of memory cells. The word lines WL1-WL4are coupled to a respective inverter 30 each formed by a PMOS transistor34 and an NMOS transistor 36 coupled in series between V_(CC) andground. The gates of the transistors 34, 36 are coupled to each otherand to a respective select line SEL WL1-SEL WL4.

[0005] In a read operation, the digit lines D, D* for all columns areequilibrated by driving an EQ* line low. An inverter 30 then drives aword line WL1-WL4 in a single row to an appropriate voltage, therebycoupling a memory cell 12 in each column to a respective pair of digitlines D, D*. The memory cell 12 in each column unbalances the digitlines D, D* to which it is coupled, and the respective sense amplifier14 senses the polarity of the unbalance and provides an appropriate datasignal.

[0006] In a write operation, a suitable voltage is first applied to aword line WL1-WL4 to couple the memory cells 12 in the respective row toa digit line D or a complimentary digit line D*. The write driver 18 forone or more columns then applies a differential voltage between thedigit lines D, D* for respective columns, which is coupled to respectivememory cells 12 for the activated row. The write driver 18 is thendisabled for a “write recovery” phase, and the word line WL1-WL4 is thendeactivated so the memory cell 12 stores the polarity of thedifferential voltage. The bias transistors 20 are provided for the array10 regardless of the type of SRAM cell used. However, in the event thememory cells 12 are loadless 4T memory cells, which are discussedfurther below, the current provided by the bias transistors 20 allow thememory cells 12 to continue to store the data, as also discussed furtherbelow.

[0007] A typical memory cell shown in FIG. 2 is a conventional6-transistor (6-T) SRAM cell 40. The SRAM cell 40 includes a pair ofNMOS access transistors 42 and 44 allow a differential voltage on thedigit lines D, D*, to be read from and written to a storage circuit 50of the SRAM cell 40. The storage circuit 50 includes NMOS pull-downtransistors 52 and 56 that are coupled in a positive-feedbackconfiguration with PMOS pull-up transistors 54 and 58, respectively.Nodes A and B are complementary inputs/output nodes of the storagecircuit 50, and the respective complementary logic values at these nodesrepresent the state of the SRAM cell 40. For example, when the node A isat logic “1” and the node B is at logic “0”, then the SRAM cell 40 isstoring a logic “1”. Conversely, when the node A is at logic “0” and thenode B is at logic “1”, then the SRAM cell 40 is storing a logic “0”.Thus, the SRAM cell 40 is bistable, i.e., the SRAM cell 40 can have oneof two stable states, logic “1” or logic “0”.

[0008] In operation during a read of the SRAM cell 40, a word-line WL,such as WL1-WL4 (FIG. 1), which is coupled to the gates of the accesstransistors 42 and 44, is driven to a voltage approximately equal toV_(CC) to turn ON the transistors 42 and 44. The access transistor 42then couples the node A to the digit line D, and the access transistor44 couples the node B to the digit line D*. Assuming the SRAM cell 40 isstoring a logic “0”, coupling the digit line D to the node A pulls downthe voltage on the digit line D enough (for example, 100-500 millivolts)to cause the sense amplifier 14 (FIG. 1) coupled between the digit linesD, D* to read the SRAM cell 40 as storing a logic “0”.

[0009] During a write operation of a logic “1” to the SRAM cell 40, forexample, a logic “1” is applied to the digit lines D, D* as adifferential voltage, and the word line WL is activated to turn ON theaccess transistors 42, 44. The transistor 42 then couples the logic “1”voltage of approximately V_(CC) to the node A, and the transistor 44couples the logic “0” voltage of approximately ground to the node B. Theword line WL is finally deactivated to turn OFF the access transistors42, 44, thereby allowing the SRAM cell 40 to continue storing the logic“1”.

[0010] Although the 6-T cell 40 shown in FIG. 2 uses PMOS pull-uptransistors 54, 58, it will be understood that other components (notshown), such as pull-up resistors (not shown), may be used in place ofthe pull-up transistors 54, 58.

[0011] Another typical SRAM cell is shown in FIG. 3. The SRAM cell shownin FIG. 3 is a conventional 4-transistor (4-T) loadless SRAM cell 60,where elements common to the SRAM cell 40 of FIG. 2 are referenced withlike numerals or letters. The SRAM cell 60 is considered loadlessbecause it uses a storage circuit 66 in which the loads formed by thepull-up transistors 54, 58 have been eliminated. Further, the NMOSaccess transistors 42 and 44 have been replaced with PMOS transistors 62and 64, respectively. With the loadless 4-T SRAM cell 60 of FIG. 3,there are no pull-up transistors to maintain the drain of the OFF NMOStransistor 52, 56 at a voltage that is sufficient to turn ON the otherNMOS transistor 52, 56. Instead, the access transistors 62, 64 arebiased in their OFF states by conventional means with a voltage thatcauses leakage currents and/or subthreshold currents to be coupled fromthe digit lines D, D* through the access transistors 62, 64. Theseleakage currents and/or subthreshold currents maintain the voltage onthe drain of the OFF NMOS transistor 52, 56, at a voltage that issufficiently high to maintain the other NMOS transistor 52, 56 in an ONcondition. In order to supply these leakage currents and/or subthresholdcurrents, the PMOS bias transistors 20 (FIG. 1) are controlled by thedigit line load signals DLL_(N) to supply currents to the digit lines D,D* when the memory cells 12 are not being accessed, as previouslyexplained. However, the impedance of the transistors 20 must besufficiently high that the digit lines D, D* in each pair can be drivenlow by the memory cells 12 and the write drivers 18.

[0012] The primary advantage of the 4-T SRAM cell 60 shown in FIG. 3compared to the 6-T SRAM cell 40 shown in FIG. 2 is that the 4-T SRAMcell 60 uses only 4 transistors and is thus more compact. As a result,the 4-T SRAM cell 60 consumes less surface are on a semiconductor die.

[0013] Although the loadless 4T SRAM cell 60 of FIG. 3 has the advantageof being more compact, it also has some disadvantages compared to the6-T SRAM cell 40 of FIG. 2. These disadvantages primarily result fromthe need to supply the correct amount of leakage and/or subthresholdcurrent through the access transistors 62, 64, and the need to use PMOSaccess transistors 62, 64 rather than NMOS access transistors 42, 44.Too little leakage and/or subthreshold current is supplied to thestorage circuit 66 may cause a data retention failure. If too muchleakage and/or subthreshold current is supplied to the storage circuit66, then the standby current limits of an array using the SRAM cell 60may be exceeded.

[0014] Another problem resulting from the use of PMOS access transistors62, 64 can be explained with reference also to FIG. 1. When power isinitially applied to an integrated circuit containing the memory array10, the digit lines D, D* can be driven to V_(CC) before the word linesWL1-WL4 are driven high. With reference to FIG. 3, if the digit lines D,D* are at a high voltage when the voltage on the word line WL is low,the access transistors 62, 64 will be turned ON, thereby coupling thestorage cell 66 to the digit lines D, D*. In fact, all of the SRAM cells60 in the array 10 will generally be coupled to their respective digitlines D, D* under these circumstances. Although the leakage and/orsubthreshold current drawn by any single SRAM cell 60 will be verysmall, the total current drawn by all of the SRAM cells 60 can be verylarge. For example, for a read current of as little as 100 microamperes(10⁻⁴ amperes), the total current drawn by a 4 megabit SRAM array duringpower-up would be 400 amperes (10⁻⁴*4*10⁶). Even though the current willnot be this high in practice because of the finite current sourcingcapability of the bias transistors 20, this amount of current is stillfar too much current to be drawn by SRAM memory devices.

[0015] Note that the problem of excessive currents at power-up does notexist for the 6-T SRAM cell 40 shown in FIG. 2 because the NMOS accesstransistors 42, 44 will be OFF if the voltages of the word lines WL areless than the voltages on the digit lines D, D*. However, although notcommonly in use, there may be circuit designs in which excessivepower-up currents could be a problem even with NMOS access transistors42, 44.

[0016] There is therefore a need for a system and method to limit thecurrent drawn by SRAM arrays during power-up, particularly for arrays ofSRAM cells having PMOS access transistors, such as loadless 4-T SRAMcells.

SUMMARY OF THE INVENTION

[0017] An array of SRAM cells arranged in rows and columns includes awordline for each row of the array and a pair of complementary digitlines for each column of the array. Each of the SRAM cells has a pair ofaccess transistors coupled to respective complementary digit lines for arespective column and a gate coupled to a wordline for a respective row.A bias circuit coupled to each of the digit lines is operable in eithera normal mode or a power-up mode. In the normal mode, the bias circuitcouples a bias current to the digit lines. In the power-up mode, thebias circuit maintains the access transistors non-conductive.

BRIEF DESCRIPTION OF THE DRAWINGS

[0018]FIG. 1 is a block diagram of a conventional SRAM array.

[0019]FIG. 2 is a schematic of a conventional 6-T SRAM cell.

[0020]FIG. 3 is a schematic of a conventional loadless 4-T SRAM cell.

[0021]FIG. 4 is a block diagram of an SRAM array according to oneembodiment of the invention.

[0022]FIG. 5 is a block diagram of an SRAM array according to anotherembodiment of the invention.

[0023]FIG. 6 is a block diagram of an SRAM array according to a furtherembodiment of the invention.

[0024]FIG. 7 is a block diagram of an SRAM array according to a furtherembodiment of the invention.

[0025]FIG. 8 is a block diagram of an SRAM device using one of the SRAMarray of FIG. 4, 6 or 7.

[0026]FIG. 9 is a block diagram of a computer system using the SRAMdevice of FIG. 8 as a cache memory.

DETAILED DESCRIPTION OF THE INVENTION

[0027]FIG. 4 is a block diagram of an SRAM array 80 according to oneembodiment of the invention where elements common to the SRAM array 10of FIG. 1 are referenced with like numerals or letters. The SRAM array80 differs from the SRAM array 10 of FIG. 1 by coupling the sources ofthe PMOS bias transistors 20 to the supply voltage V_(CC) through a PMOSbias supply transistor 82 rather than directly to V_(CC), as in the SRAMarray 10 of FIG. 1. The gate of the bias supply transistor 82 is coupledto a power-up circuit 84. The power-up circuit 84 is designed to turnOFF the bias supply transistor 82 to remove power V_(CC) from the biastransistors 20 at power-up at least until voltages in the SRAM array 80have stabilized. As a result, the voltage on the digit lines D, D*remain at zero volts during power-up to prevent the PMOS accesstransistors 62, 64 (FIG. 3) from turning ON during power-up. When thevoltage on the word lines WL1-WL4 have stabilized as a sufficiently highvoltage to maintain the PMOS access transistors 62, 64 (FIG. 3) OFF, thepower-up circuit 84 turns ON the bias supply transistor 82. The biassupply transistor 82 then supplies power V_(CC) to the bias transistors20 to allow the bias transistors 20 to supply a leakage current to eachdigit line D, D* that is sufficiently high to allow each SRAM cell 12 tostore data.

[0028] In another embodiment of the invention shown in FIG. 5, an SRAMarray 86 operates in essentially the same manner as the power-up circuit84 of FIG. 4 except that a voltage is applied to the sources of the PMOSbias transistors 20 by a power-up circuit 90 rather than by a biassupply transistor 82 as in the embodiment of FIG. 4. The power-upcircuit supplies a voltage to the sources of the PMOS bias transistors20 that is maintained at a relatively low voltage, preferably ground,during power-up. As a result, the voltages on the digit lines D, D*remain at zero volts during power-up to prevent the PMOS accesstransistors 62, 64 (FIG. 3) from turning ON during power-up. Once thevoltages in the SRAM array 60 have stabilized, the power-up circuit 90supplies a voltage to the sources of the bias transistors 20 that allowsthe bias transistors 20 to supply a leakage current to each digit lineD, D* that is sufficiently high to allow each SRAM cell 12 to storedata.

[0029] In another embodiment of the invention shown in FIG. 6, an SRAMarray 92 includes a power-up circuit 94 having respective outputs thatare coupled to the gate of each of the PMOS bias transistors 20. Thepower-up circuit 94 receives a PWR-UP signal that is active high duringpower-up, and a digit line load DLL signal. During power-up, thepower-up circuit 94 responds to the active high PWR-UP signal to apply avoltage to the gate of each bias transistor 20 that increases at leastas fast as the the voltage V_(CC) supplied to the sources of the PMOSbias transistors 20. As a result, the bias transistors 20 cannot turn ONto apply a voltage to the digit lines D, D* that is sufficient to allowthe access transistors 62, 64 (FIG. 3) to turn ON during power-up. Oncethe voltages in the SRAM array 92 have stabilized, the power-up circuit94 couples the DLL signals to the gates of respective bias transistor20, which then biase the digit lines D, D* to supply a suitable leakagecurrent. Although the bias transistor 20 is shown in FIG. 6 as being aPMOS transistor, it will be understood the power-up circuit 94 mayinstead be used with an SRAM array having NMOS bias transistors (notshown).

[0030] In another embodiment of the invention shown in FIG. 7, an SRAMarray 96 includes a power-up circuit 98 coupled to the gates of the PMOSbias transistors 20. The power-up circuit 90 supplies a voltage to thegates of the bias transistors 20 that increases at least as fast as thevoltage V_(CC) supplied to the sources of the PMOS bias transistors 20.As a result, the bias transistors 20 cannot turn ON to apply a voltageto the digit lines D, D* that is sufficient to allow the accesstransistors 62, 64 (FIG. 3) to turn ON. Once the voltages in the SRAMarray 96 have stabilized, the power-up circuit 98 supplies a voltage tothe gates of the bias transistors 20 that is sufficiently low to turn ONthe bias transistors 20. The bias transistors 20 can then apply asub-threshold current to the access transistors 62, 64.

[0031] An SRAM array 100 according to still another embodiment of theinvention is shown in FIG. 8. The SRAM array 100 is identical to theSRAM array 80 of FIG. 4 except that NMOS equalization transistors 102are used rather than PMOS transistors 18, which are used in the SRAMarray 80, NMOS bias transistors 106 are used rather than PMOS biastransistors 20, which are used in the SRAM array 80, and an NMOS biassupply transistor 108 is used rather than a PMOS bias supply transistor82, which is used in the SRAM array 80. As a result, the equalizationtransistors 102 are turned ON by an active high EQ signal rather than anactive low EQ* signal, and the bias supply transistor 108 is turned ONby a high at the output of a power-up circuit 110 rather than by a lowgenerated by the power-up circuit 84.

[0032] Although specific designs for the power-up circuits 84, 90, 94,98, 110 have not been shown or described, conventional power-up circuitsmay either be used or easily adapted for use as the power-up circuits84, 90, 94, 98, 110. Suitable designs are disclosed, for example, inU.S. Pat. No. 5,555,166 to Sher, U.S. Pat. No. 5,557,579 to Raad et al.,and U.S. Pat. No. 5,898,625 to Manning, all of which are incorporatedherein by reference.

[0033]FIG. 9 is a functional block diagram of a synchronous SRAM 120including an SRAM power-up circuit according to the present invention.In the synchronous SRAM 120, all operations are referenced to aparticular edge of an external clock signal CLK, typically the risingedge, as known in the art. The synchronous SRAM 120 includes an addressregister 122 which latches an address received on an address bus 124 inresponse to the external clock signal CLK. An address decoder 126receives the latched address from the address register 122 and outputs adecoded address to a memory-cell array 128 including a number ofloadless 4-T SRAM memory cells (not shown in FIG. 8) arranged in rowsand columns. An SRAM power-up circuit 129, which may be one of thepower-up circuits 84, 90, 92, 98, 110, is coupled to the array 128. Thelatched address stored in the address register 122 is also output to aburst counter circuit 130 receiving the external clock signal CLK and amode signal MODE. In response to the external clock signal CLK, theburst counter circuit 130 develops sequential addresses beginning withthe memory address latched by the address register 122, and outputs thesequential addresses to the address decoder 126. The mode signal MODEdetermines whether the sequence of memory addresses developed by theburst counter circuit 130 is a linear burst sequence or an interleavedburst sequence.

[0034] Sense amplifiers 132, such as the sense amplifiers 14 shown inFIGS. 4-8 are coupled to respective columns of the memory-cell array 128and operate to sense the data stored in addressed memory cells in thememory-cell array 128, as previously explained. The sense amplifiers 132output the sensed data through an output buffers 134 and onto a data bus136. An input register 138 latches data placed on the data bus 136 inresponse to the external clock signal CLK. The data latched in the inputregister 138 are output to write driver circuits 139, such as the writedrivers 16 of FIGS. 4-8. The write driver circuits 139 are, in turn,coupled to the memory-cell array 128 and operate as previously describedto write data to addressed memory cells in the memory-cell array 128.

[0035] The synchronous SRAM 120 further includes a control circuit 140that controls operation of the various components of the synchronousSRAM 120 during data transfer operations and during testing of thesynchronous SRAM. The control circuit 140 receives the external clocksignal CLK, an output enable signal OE, a chip enable signal CE, and awrite enable signal WE, and generates a number of internal controlsignals to control the various components of the synchronous SRAM 120 inresponse to these signals. In addition, the control circuit 140 developsappropriate signals to actuate the SRAM power-up circuit 129 when poweris initially applied to the SRAM 120.

[0036] During a read data transfer operation, an external circuit (notshown in FIG. 9) places an address on the address bus 124, activates theoutput enable signal OE and the chip enable signal CE, and deactivatesthe write enable signal WE. The address on the address bus 124 islatched by the address register 122 on the next rising edge of theexternal clock signal CLK. In response to the deactivated write enablesignal WE, the control circuit 140 disables the input register circuit138 and places the output buffers 134 in a low impedance state couplingthe sense amplifiers 132 to the data bus 136 through the output buffers134. Typically, on the next subsequent rising edge of the external clocksignal CLK, the latched address stored in the address register 122 isoutput to the address decoder 126, which decodes the memory address andactivates the addressed memory cells in the memory-cell array 128. Thesense amplifiers 132 thereafter sense the data stored in the addressedmemory cells and outputs the data to the output buffers 134 which, inturn, places the data on the data bus 136 where it is available to beread by the external circuit.

[0037] During a write data transfer operation, the external circuitplaces an address on the address bus 124, data on the data bus 136,deactivates the output enable signal OE, and activates the chip enablesignal CE and write enable signal WE. In response to the active writeenable signal WE and inactive output enable signal OE, the controlcircuit 140 places the output buffers 134 in a high impedance state andenables the input register 138. On the next subsequent rising edge ofthe external clock signal CLK, the address register 122 latches theaddress placed on the address bus 124, and the input register 138latches the data placed on the data bus 136. Typically on the nextsubsequent rising edge of the external clock signal CLK, the latchedaddress is output to the address decoder 126, which decodes the addressand activates the addressed memory cells in the memory-cell array 128,and the latched data stored in the input register 138 is output to thewrite driver circuits 139. The write driver circuits 139 operate aspreviously described to write the data to the addressed memory cells inthe memory-cell array 128.

[0038]FIG. 10 shows a computer system 300 that may use an SRAMcontaining an embodiment of the SRAM power-up circuit according to thepresent invention. The computer system 300 includes a processor 302 forperforming various computing functions, such as executing specificsoftware to perform specific calculations or tasks. The processor 302includes a processor bus 304 that normally includes an address bus, acontrol bus, and a data bus. In addition, the computer system 300includes one or more input devices 314, such as a keyboard or a mouse,coupled to the processor 302 to allow an operator to interface with thecomputer system 300. Typically, the computer system 300 also includesone or more output devices 316 coupled to the processor 302, such outputdevices typically being a printer or a video terminal. One or more datastorage devices 318 are also typically coupled to the processor 302 toallow the processor 302 to store data in or retrieve data from internalor external storage media (not shown). Examples of typical storagedevices 318 include hard and floppy disks, tape cassettes, and compactdisk read-only memories (CD-ROMs). The processor 302 is also typicallycoupled to system memory 320, which is normally dynamic random accessmemory (“DRAM”) through a memory controller 330. The memory controller330 normally includes a control bus 336 and an address bus 338 that arecoupled to the system memory 320. A data bus 340 is coupled from thesystem memory 320 to the processor bus 304 either directly (as shown),through the memory controller 330, or by some other means. Finally, thecomputer system 300 contains cache memory 342 for storing recently usedinstructions and data for faster access by the processor 302, as is wellknown to those skilled in the art. As is typical, the cache memory 340is implemented by SRAM devices, in this case, the SRAM 120 shown in FIG.9, because of the fast access times of SRAM devices.

[0039] From the foregoing it will be appreciated that, although specificembodiments of the invention have been described herein for purposes ofillustration, various modifications may be made without deviating fromthe spirit and scope of the invention. Accordingly, the invention is notlimited except as by the appended claims.

1. An SRAM cell array, comprising: an array of SRAM cells arranged inrows and columns, the array including a wordline for each row of thearray and a pair of complementary digit lines for each column of thearray, each of the SRAM cells having an a pair of access transistorscoupled to respective complementary digit lines for a respective columnand a gate coupled to a wordline for a respective row; and a biascircuit coupled to each of the digit lines, the bias circuit beingoperable to couple a bias current to the digit lines in a normal modeand to couple a voltage to the digit lines that maintains the accesstransistors non-conductive in a power-up mode.
 2. The SRAM cell array ofclaim 1 wherein the bias circuit comprises: a respective bias transistorcoupled between a supply node and each of the digit lines; a bias supplytransistor coupled between a supply voltage and the supply node of eachbias transistor; and a power-up circuit coupled to a gate of the biassupply transistor, the power-up circuit being operable in a normal modeto couple a voltage to the gate of the bias supply transistor thatrenders the bias supply transistor conductive, and being operable in thepower-up mode to couple a voltage to the gate of the bias supplytransistor that renders the bias supply transistor non-conductive. 3.The SRAM cell array of claim 2 wherein each of the SRAM cells comprise aloadless 4-T SRAM cell having PMOS access transistors, wherein the biassupply transistor comprises a PMOS transistor coupled to a positivesupply voltage, wherein each of the bias transistors comprise a PMOStransistor, and wherein the power-up circuit is operable to couplesubstantially ground potential to the gate of the PMOS bias supplytransistor in the normal mode and to couple the gate of the PMOS biassupply transistor to substantially the positive supply voltage in thepower-up mode.
 4. The SRAM cell array of claim 1 wherein the biascircuit comprises: a respective bias transistor coupled between a supplyterminal and each of the digit lines; and a power-up circuit coupled tothe supply terminal of each of the bias transistors, the power-upcircuit being operable in a normal mode to couple a supply voltage tothe supply terminal of each of the bias transistors, and being operablein the power-up mode isolate the power supply voltage from the supplyterminal of each of the bias transistors.
 5. The SRAM cell array ofclaim 4 wherein each of the SRAM cells comprise a loadless 4-T SRAM cellhaving PMOS access transistors, and wherein each of the bias transistorscomprise a PMOS transistor.
 6. The SRAM cell array of claim 1 whereinthe bias circuit comprises: a respective bias transistor coupled betweena supply voltage and each of the digit lines; and a power-up circuitcoupled to a gate of each of the bias transistors, the power-up circuitreceiving a power-up signals and a digit line load signal correspondingto the bias transistors for each pair of complimentary digit lines, thepower-up circuit being operable in response to a power-up signalindicative of a normal mode to couple each of the digit line loadsignals to the gate of the respective bias transistor to renders thebias transistors conductive, and being operable in response to apower-up signal indicative of a power-up mode to couple a voltage to thegate of the bias transistors that renders the bias transistorsnon-conductive.
 7. The SRAM cell array of claim 6 wherein each of theSRAM cells comprise a loadless 4-T SRAM cell having PMOS accesstransistors, and wherein each of the bias transistors comprise a PMOStransistor.
 8. The SRAM cell array of claim 1 wherein the bias circuitcomprises: a respective bias transistor coupled between a supply voltageand each of the digit lines; and a power-up circuit coupled to a gate ofeach of the bias transistors, the power-up circuit being operable in anormal mode to apply a voltage to a gate of each of the bias transistorsthat renders the bias transistors conductive, and being operable in apower-up mode to apply a voltage to the gate of each of the biastransistors that renders the bias transistors non-conductive.
 9. TheSRAM cell array of claim 8 wherein each of the SRAM cells comprise aloadless 4-T SRAM cell having PMOS access transistors, and wherein eachof the bias transistors comprise a PMOS transistor.
 10. The SRAM cellarray of claim 1 wherein each of the SRAM cells comprise a loadless 4-TSRAM cell having PMOS access transistors, and wherein the bias circuitis operable to couple a positive current to the digit lines in thenormal mode and to terminate coupling the positive current from thedigit lines in the power-up mode.
 11. An SRAM cell array, comprising: anarray of SRAM cells arranged in rows and columns, each of the SRAM cellsincluding a pair of access switches each having an access terminal and acontrol terminal; a wordline coupled to the control terminal of each ofthe access switches in a respective row; a pair of complementary digitlines coupled to respective access terminals of each of the accessswitches in a respective column; a respective sense amplifier coupledbetween the complementary digit lines in each of the pairs ofcomplementary digit lines; a respective write driver coupled between thecomplementary digit lines in each of the pairs of complementary digitlines; a respective equilibration switch coupled between thecomplementary digit lines in each of the pairs of complementary digitlines; and a bias circuit coupled to each of the digit lines, the biascircuit being operable to couple a bias current to the digit lines in anormal mode and to couple a voltage to the digit lines that maintainsthe access switches non-conductive in a power-up mode.
 12. The SRAM cellarray of claim 11 wherein the bias circuit comprises: a respective biastransistor coupled between a supply node and each of the digit lines; abias supply transistor coupled between a supply voltage and the supplynode of each bias transistor; and a power-up circuit coupled to a gateof each of the bias supply transistors, the power-up circuit beingoperable in a normal mode to couple a voltage to the gate of the biassupply transistor that renders the bias supply transistor conductive,and being operable in the power-up mode to couple a voltage to the gateof the bias supply transistor that renders the bias supply transistornon-conductive.
 13. The SRAM cell array of claim 12 wherein each of theaccess switches comprise PMOS access transistors, wherein each of theSRAM cells comprise a loadless 4-T SRAM cell, wherein each of the biastransistors comprise a PMOS transistor, and wherein the bias supplytransistor comprises a PMOS transistor coupled to a positive supplyvoltage, and wherein the power-up circuit is operable to couplesubstantially ground potential to the gate of the PMOS bias supplytransistors in the normal mode and to couple the gate of the PMOS biassupply transistors to substantially the positive supply voltage in thepower-up mode.
 14. The SRAM cell array of claim 11 wherein the biascircuit comprises: a respective bias transistor coupled between a supplyterminal and each of the digit lines; and a power-up circuit coupled tothe supply terminal of each of the bias transistors, the power-upcircuit being operable in a normal mode to couple a supply voltage tothe supply terminal of each of the bias transistors, and being operablein the power-up mode isolate the power supply voltage from the supplyterminal of each of the bias transistors.
 15. The SRAM cell array ofclaim 14 wherein each of the SRAM cells comprise a loadless 4-T SRAMcell having PMOS access transistors, and wherein each of the biastransistors comprise a PMOS transistor.
 16. The SRAM cell array of claim11 wherein the bias circuit comprises: a respective bias transistorcoupled between a supply voltage and each of the digit lines; and apower-up circuit coupled to a gate of each of the bias transistors, thepower-up circuit receiving a power-up signals and a digit line loadsignal corresponding to the bias transistors for each pair ofcomplimentary digit lines, the power-up circuit being operable inresponse to a power-up signal indicative of a normal mode to couple eachof the digit line load signals to the gate of the respective biastransistor to renders the bias transistors conductive, and beingoperable in response to a power-up signal indicative of a power-up modeto couple a voltage to the gate of the bias transistors that renders thebias transistors non-conductive.
 17. The SRAM cell array of claim 16wherein each of the SRAM cells comprise a loadless 4-T SRAM cell havingPMOS access transistors, and wherein each of the bias transistorscomprise a PMOS transistor.
 18. The SRAM cell array of claim 11 whereinthe bias circuit comprises: a respective bias transistor coupled betweena supply voltage and each of the digit lines; and a power-up circuitcoupled to a gate of each of the bias transistors, the power-up circuitbeing operable in a normal mode to apply a voltage to a gate of each ofthe bias transistors that renders the bias transistors conductive, andbeing operable in a power-up mode to apply a voltage to the gate of eachof the bias transistors that renders the bias transistorsnon-conductive.
 19. The SRAM cell array of claim 18 wherein each of theSRAM cells comprise a loadless 4-T SRAM cell having PMOS accesstransistors, and wherein each of the bias transistors comprise a PMOStransistor.
 20. The SRAM cell array of claim 11 wherein each of theaccess switches comprise PMOS access transistors, wherein each of theSRAM cells comprise a loadless 4-T SRAM cell, and wherein the biascircuit is operable to couple a positive supply current to the digitlines in the normal mode and to terminate coupling the positive currentfrom the digit lines in the power-up mode.
 21. The SRAM cell array ofclaim 11 wherein each of the access switches comprise a transistor, theaccess terminal for each of the access switches comprises a drain or asource of the access transistor, and the control terminal for each ofthe access switches comprises a gate of the access transistor.
 22. Astatic random access memory (“SRAM”) comprising: an address bus; acontrol bus; a data bus; an address decoder coupled to the address bus;a read/write circuit coupled to the data bus; a memory-cell arraycoupled to the address decoder, control circuit, and read/write circuit;the memory-cell array comprising: an array of SRAM cells arranged inrows and columns, each of the SRAM cells including a pair of accessswitches each having an access terminal and a control terminal; awordline coupled to the control terminal of each of the access switchesin a respective row; a pair of complementary digit lines coupled torespective access terminals of each of the access switches in arespective column; a respective sense amplifier coupled between thecomplementary digit lines in each of the pairs of complementary digitlines; a respective write driver coupled between the complementary digitlines in each of the pairs of complementary digit lines; and arespective equilibration switch coupled between the complementary digitlines in each of the pairs of complementary digit lines; a bias circuitcoupled to each of the digit lines, the bias circuit being operable tocouple a bias current to the digit lines in a normal mode and to couplea voltage to the digit lines that maintains the access switchesnon-conductive in a power-up mode; and a control circuit operable tocontrol the operation of the SRAM.
 23. The SRAM of claim 22 wherein thebias circuit comprises: a respective bias transistor coupled between asupply node and each of the digit lines; a bias supply transistorcoupled between a supply voltage and the supply node of each biastransistor; and a power-up circuit coupled to a gate of the supply biastransistor, the power-up circuit being operable in a normal mode tocouple a voltage to the gate of the bias supply transistor that rendersthe bias supply transistor conductive, and being operable in thepower-up mode to couple a voltage to the gate of the bias supplytransistor that renders the bias supply transistor non-conductive. 24.The SRAM of claim 23 wherein the bias supply transistor comprises a PMOStransistor coupled to a positive supply voltage, wherein each of theaccess switches comprise PMOS access transistors, wherein each of theSRAM cells comprise a loadless 4-T SRAM cell, wherein each of the biastransistors comprise a PMOS transistor, and wherein the power-up circuitis operable to couple substantially ground potential to the gate of thePMOS bias supply transistor in the normal mode and to couple the gate ofthe PMOS bias supply transistor to substantially the positive supplyvoltagein the power-up mode.
 25. The SRAM of claim 22 wherein the biascircuit comprises: a respective bias transistor coupled between a supplyterminal and each of the digit lines; and a power-up circuit coupled tothe supply terminal of each of the bias transistors, the power-upcircuit being operable in a normal mode to couple a supply voltage fromthe positive supply voltage to the supply terminal of each of the biastransistors, and being operable in the power-up mode isolate the powersupply voltage from the supply terminal of each of the bias transistors.26. The SRAM of claim 25 wherein each of the SRAM cells comprise aloadless 4-T SRAM cell having PMOS access transistors, and wherein eachof the bias transistors comprise a PMOS transistor.
 27. The SRAM ofclaim 22 wherein the bias circuit comprises: a respective biastransistor coupled between a supply voltage and each of the digit lines;and a power-up circuit coupled to a gate of each of the biastransistors, the power-up circuit receiving a power-up signals and adigit line load signal corresponding to the bias transistors for eachpair of complimentary digit lines, the power-up circuit being operablein response to a power-up signal indicative of a normal mode to coupleeach of the digit line load signals to the gate of the respective biastransistor to renders the bias transistors conductive, and beingoperable in response to a power-up signal indicative of a power-up modeto couple a voltage to the gate of the bias transistors that renders thebias transistors non-conductive.
 28. The SRAM of claim 27 wherein eachof the SRAM cells comprise a loadless 4-T SRAM cell having PMOS accesstransistors, and wherein each of the bias transistors comprise a PMOStransistor.
 29. The SRAM of claim 22 wherein the bias circuit comprises:a respective bias transistor coupled between a supply voltage and eachof the digit lines; and a power-up circuit coupled to a gate of each ofthe bias transistors, the power-up circuit being operable in a normalmode to apply a voltage to a gate of each of the bias transistors thatrenders the bias transistors conductive, and being operable in apower-up mode to apply a voltage to the gate of each of the biastransistors that renders the bias transistors non-conductive.
 30. TheSRAM of claim 29 wherein each of the SRAM cells comprise a loadless 4-TSRAM cell having PMOS access transistors, and wherein each of the biastransistors comprise a PMOS transistor.
 31. The SRAM of claim 22 whereineach of the access switches comprise PMOS access transistors, whereineach of the SRAM cells comprise a loadless 4-T SRAM cell, and whereinthe bias circuit is operable to couple a positive current to the digitlines in the normal mode and to terminate coupling the positive currentfrom the digit lines in the power-up mode.
 32. The SRAM of claim 22wherein each of the access switches comprise a transistor, the accessterminal for each of the access switches comprises a drain or a sourceof the access transistor, and the control terminal for each of theaccess switches comprises a gate of the access transistor.
 33. The SRAMof claim 22, wherein the SRAM comprises a synchronous SRAM.
 34. Acomputer system, comprising: a processor having a processor bus; atleast one input device coupled to the processor through the processorbus; at least one output device coupled to the processor through theprocessor bus; at least one data storage devices coupled to theprocessor through the processor bus a system memory coupled to theprocessor through the processor bus; and an static random access cachememory coupled to the processor through the processor bus, the staticrandom access cache memory comprising: an address bus; a control bus; adata bus; an address decoder coupled to the address bus; a read/writecircuit coupled to the data bus; a memory-cell array coupled to theaddress decoder, control circuit, and read/write circuit; thememory-cell array comprising: an array of SRAM cells arranged in rowsand columns, each of the SRAM cells including a pair of access switcheseach having an access terminal and a control terminal; a wordlinecoupled to the control terminal of each of the access switches in arespective row; a pair of complementary digit lines coupled torespective access terminals of each of the access switches in arespective column; a respective sense amplifier coupled between thecomplementary digit lines in each of the pairs of complementary digitlines; a respective write driver coupled between the complementary digitlines in each of the pairs of complementary digit lines; and arespective equilibration switch coupled between the complementary digitlines in each of the pairs of complementary digit lines; a bias circuitcoupled to each of the digit lines, the bias circuit being operable tocouple a bias current to the digit lines in a normal mode and to couplea voltage to the digit lines that maintains the access switchesnon-conductive in a power-up mode; and a control circuit operable tocontrol the operation of the SRAM.
 35. The computer system of claim 34wherein the bias circuit comprises: a respective bias transistor coupledbetween a supply node and each of the digit lines; a bias supplytransistor coupled between a supply voltage and the supply node of eachbias transistor; and a power-up circuit coupled to a gate of the biastransistor, the power-up circuit being operable in a normal mode tocouple a voltage to the gate of the bias supply transistor that rendersthe bias supply transistor conductive, and being operable in thepower-up mode to couple a voltage to the gate of the bias supplytransistor that renders the bias supply transistor non-conductive. 36.The computer system of claim 35 wherein the bias supply transistorcomprises a PMOS transistor coupled to a positive supply voltage,wherein each of the access switches comprise PMOS access transistors,wherein each of the SRAM cells comprise a loadless 4-T SRAM cell,wherein each of the bias transistors comprise a PMOS transistor, andwherein the power-up circuit is operable to couple substantially groundpotential to the gate of the PMOS bias supply transistor in the normalmode and to couple the gate of the PMOS bias supply transistor tosubstantially the positive supply voltage in the power-up mode.
 37. Thecomputer system of claim 34 wherein the bias circuit comprises: arespective bias transistor coupled between a supply terminal and each ofthe digit lines; and a power-up circuit coupled to the supply terminalof each of the bias transistors, the power-up circuit being operable ina normal mode to couple a supply voltage from the positive supplyvoltage to the supply terminal of each of the bias transistors, andbeing operable in the power-up mode isolate the power supply voltagefrom the supply terminal of each of the bias transistors.
 38. Thecomputer system of claim 37 wherein each of the SRAM cells comprise aloadless 4-T SRAM cell having PMOS access transistors, and wherein eachof the bias transistors comprise a PMOS transistor.
 39. The computersystem of claim 34 wherein the bias circuit comprises: a respective biastransistor coupled between a supply voltage and each of the digit lines;and a power-up circuit coupled to a gate of each of the biastransistors, the power-up circuit receiving a power-up signals and adigit line load signal corresponding to the bias transistors for eachpair of complimentary digit lines, the power-up circuit being operablein response to a power-up signal indicative of a normal mode to coupleeach of the digit line load signals to the gate of the respective biastransistor to renders the bias transistors conductive, and beingoperable in response to a power-up signal indicative of a power-up modeto couple a voltage to the gate of the bias transistors that renders thebias transistors non-conductive.
 40. The computer system of claim 39wherein each of the SRAM cells comprise a loadless 4-T SRAM cell havingPMOS access transistors, and wherein each of the bias transistorscomprise a PMOS transistor.
 41. The computer system of claim 34 whereinthe bias circuit comprises: a respective bias transistor coupled betweena supply voltage and each of the digit lines; and a power-up circuitcoupled to a gate of each of the bias transistors, the power-up circuitbeing operable in a normal mode to apply a voltage to a gate of each ofthe bias transistors that renders the bias transistors conductive, andbeing operable in a power-up mode to apply a voltage to the gate of eachof the bias transistors that renders the bias transistorsnon-conductive.
 42. The computer system of claim 41 wherein each of theSRAM cells comprise a loadless 4-T SRAM cell having PMOS accesstransistors, and wherein each of the bias transistors comprise a PMOStransistor.
 43. The computer system of claim 34 wherein each of theaccess switches comprise PMOS access transistors, wherein each of theSRAM cells comprise a loadless 4-T SRAM cell, and wherein the biascircuit is operable to couple a positive current to the digit lines inthe normal mode and to terminate coupling the positive current from thedigit lines in the power-up mode.
 44. The computer system of claim 34wherein each of the access switches comprise a transistor, the accessterminal for each of the access switches comprises a drain or a sourceof the access transistor, and the control terminal for each of theaccess switches comprises a gate of the access transistor.
 45. Thecomputer system of claim 34, wherein the SRAM comprises a synchronousSRAM.
 46. In an array of SRAM cells arranged in rows and columns andhaving a pair of complementary digit lines for each column of the arraycoupled to respective access transistors for each SRAM cell, a method ofcontrolling the power-up current drawn by the array, comprising:applying a predetermined bias current to the digit lines in a normalmode; and coupling the digit lines to a voltage that maintains theaccess transistors nonconductive in a power-up mode.
 47. The method ofclaim 46 wherein a respective bias transistor is coupled between asupply node and each of the digit lines, and wherein the act of biasingthe digit lines to a predetermined bias voltage in a normal modecomprises coupling a voltage to the gate of the bias transistor thatrenders the bias transistor conductive during the normal mode.
 48. Themethod of claim 46 wherein a respective bias transistor is coupledbetween a supply node and each of the digit lines, and wherein the actof coupling the digit lines to a voltage that maintains the accesstransistors non-conductive in a power-up mode comprises coupling avoltage to the gate of the bias transistor that renders the biastransistor non-conductive in the power-up mode.
 49. The method of claim46 wherein a respective bias transistor is coupled between a supplyvoltage and each of the digit lines, wherein the act of biasing thedigit lines to a predetermined bias voltage in a normal mode comprisescoupling a voltage to the gate of the bias transistor that renders thebias transistor conductive during the normal mode, and wherein the actof coupling the digit lines to a voltage that maintains the accesstransistors non-conductive in a power-up mode comprises coupling avoltage to the gate of the bias transistor that renders the biastransistor non-conductive in the power-up mode.
 50. The method of claim49 wherein each of the SRAM cells comprise a loadless 4-T SRAM cellhaving PMOS access transistors, wherein each of the bias transistorcomprises a PMOS transistor coupled to a positive supply voltage,wherein the act of coupling a voltage to the gate of the bias transistorthat renders the bias transistor conductive during the normal modecomprises coupling substantially ground potential to the gate of thePMOS bias transistor in the normal mode, and wherein the act of couplinga voltage to the gate of the bias transistor that renders the biastransistor non-conductive in the power-up mode comprises coupling thegate of the PMOS bias transistor to substantially the positive supplyvoltage in the power-up mode.
 51. The method of claim 46, wherein arespective bias transistor is coupled between a supply terminal and eachof the digit lines, and wherein the act of biasing the digit lines to apredetermined bias voltage in a normal mode comprises coupling a supplyvoltage from the supply terminal each of the bias transistors.
 52. Themethod of claim 51, wherein a respective bias transistor is coupledbetween a supply terminal and each of the digit lines, and wherein theact of coupling the digit lines to a voltage that maintains the accesstransistors non-conductive in a power-up mode comprises isolating thesupply voltage from the supply terminal of each of the bias transistors.53. The method of claim 46, wherein a respective bias transistor iscoupled between a supply terminal and each of the digit lines, whereinthe act of applying a predetermined bias current to the digit lines in anormal mode comprises coupling a supply voltage from the supply terminaleach of the bias transistors, and wherein the act of coupling the digitlines to a voltage that maintains the access transistors non-conductivein a power-up mode comprises isolating the supply voltage from thesupply terminal of each of the bias transistors.